PROFITEST PRIME | PROFITEST PRIME AC | |
---|---|---|
Item number | M516G | M516H |
Product details page | Details | Details |
Indication | Digital | Digital |
Limit value indication | x | x |
Isolation resistance measuring range | 0.05 - 1200 | 0.05 - 1200 |
Rest voltage measurement | x | x |
Loop impedance measurement | x | x |
Protective conductor resistance measurement | x | x |
Protective conductor current | x | x |
Differential current | x | x |
Contact current | x | x |
Automatic test sequence | x | x |
Measured value memory | x | x |
Interface | x | x |
Phase sequence determination | x | x |
RCD tripping test with nominal residual current and simultaneously rising residual current | x | |
RCD tripping test with nominal residual current | x | x |
Status display of internal memory | x | x |
Creation of test procedures | x | x |
Testing of charging stations, simulation of vehicle status | x | |
Insulation resistance measurement with ramp function | x | x |
Voltage measurement U L-N-PE |
U L-N U L-PE U N-PE |
|
Help function with connection diagrams | x | x |
Connection for test probe with remote triggering | x | x |
Z L-PE loop measurement up to 690 V AC / 800 V DC | x | |
Battery status indicator | x | x |
Voltage drop measurement | x | |
Phase sequence test | x | x |
Z L-PE loop measurement with type A and/or type B RCD | x | x |
Low resistance measurement with ramp function | x | |
Detection of short-circuit current/overvoltage protection devices | x | x |
Loop measurement without RCD tripping | x | x |
RCD test | x | x |
Measurement of temperature and humidity | x | x |
Measurement functions selectable via rotary switch | x | x |
Bluetooth interface | x | x |
RCD test with rising residual current | x | x |
Mains internal resistance measurement | x | x |
Measurement of residual voltage | x | x |
Bidirectional data exchange | x | x |
Testing of IMD | x | x |
Updateable | x | x |
Testing of IMDs and RCMs | x | |
Voltage test (high voltage test) | ||
High-voltage test 2.5 kV AC, 500 VA, 200 mA | ||
Structured measurement value memory |